Tag Archives: Bits&Chips

Cover Article Bits & Chips – Ensuring quality when scaling agile

Posted on September 28, 2018 by

Proud to see that the article I wrote with Mette Bruhn-Pedersen on quality in scaled agile environments is the cover article of the september Issue of Bits & Chips magazine. The article gives an insight in what the Scaled Agile Framework (SAFe) … Continue reading →

Posted in Agile, Bits & Chips, Scaling Agile | Tagged , , , , , , , | 3 Comments

Refinement as a quality enabler-lessons learned in an agile sales environment

Posted on November 1, 2017 by

I currently work as an Agile coach in a sales environment. A commercial environment differs from a general IT setting and applying agile in this volatile environment brings its own challenges. Fortunately, when you start translating these challenges to the … Continue reading →

Posted in Agile in de Echte Wereld, Bits & Chips, SCRUM | Tagged , , , , , , | Leave a comment

Agile Retrospectives: it’s OK when something fails

Posted on November 23, 2015 by

For the 9th article in the Bits&Chips series I collaborated with Ben Linders. Who’s Ben: He is one of the Agile Retrospectives Authorities and besides the book “getting Value out of Agile Retrospectives’. he gives many workshops on the topic. … Continue reading →

Posted in Agile, Agile in de Echte Wereld, SCRUM | Tagged , , , , , , , | 2 Comments

Agile and testing

Posted on March 26, 2013 by

For the Bits & Chips magazine I wrote an article in which I describe three different test teams. All three are working in an Agile environment and all three teams experience their work in a different manner. In this article … Continue reading →

Posted in Agile, Column, SCRUM | Tagged , , , , | 2 Comments

New Column Bits & Chips Magazine

Posted on June 27, 2012 by

New Column in the Bits & Chips magazine.  Starting the June issue I will  write a column on testing and test related topics. What is Bits & Chips? Bits & Chips is the leading magazine for the high tech industry … Continue reading →

Posted in Column, lean, Testing | Tagged , | Leave a comment